Abstract
The reasons for low sensitivity and memory effects in the determination of lanthanum and samarium in graphite furnace atomic absorption spectrometry (GFAAS) have been investigated experimentally using X-ray diffraction analysis (XRD), Auger electron microscopy (AES), X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). The formation of refractory carbides of La and Sm on the graphite surface is an important reason for their low sensitivity and memory effects. A very high sensitivity has been achieved in the determination of samarium by tantalum probe atomization, but the intercalation of SmTaO 4 into tantalum surface leads to an abrupt decrease in sensitivity.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
