Year-end Sale % OFF 
Abstract
A new scheme of two-beam X-ray diffractometry on the “X-Ray Crystallography and Physical Materials Science” (XCPM) beamline at the Kurchatov Synchrotron Radiation Source (KSRS) has been experimentally investigated. The scheme includes a standard double-crystal monochromator and a narrow slit installed in front of the sample. Measurements have been performed for the Si 111 and 311 reflections in the monochromator and the Si 111 and 220 reflections in the sample crystal. It is shown that this scheme allows one to obtain a near-proper diffraction reflection curve even in the case of symmetric diffraction if the Bragg angle for the monochromator exceeds the Bragg angle for the crystal sample by a factor of 2 or more. The experimental results coincide well with the theory.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
