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Abstract
The transport processes in the contact line region (junction of evaporating thin liquid film, vapor, and substrate) of stationary steady-state evaporating thin films of hexane with various bulk compositions were studied experimentally. The substrate temperature distribution and liquid film thickness profile were measured, analyzed, and compared with previous results on other systems. The results demonstrate that small changes in the bulk composition significantly alter the characteristics of the transport processes in the contact line region. The curvature gradient at the liquid-vapor interface is a strong function of evaporation rate and composition. Concentration and temperature gradients give interfacial shear stresses and flow patterns that enhance contact line stability.
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