Abstract
The influence of Al2O3 nanofilms formed on the surface of Al during its oxidation on contact electrical and thermal resistances is experimentally studied. The structure of the thermal conductivity of the real contact and of the ratio of its components is considered as a function of the film properties. The advisability of determining the film conduction from the contact electrical resistance is grounded. The measured current-voltage characteristics of the Al-Al2O3-Al system are given. The electrical and thermal resistances are computed, the constriction resistances in the contact pair of samples in experimental conditions are calculated, and the film resistances are determined. The polarity of conductivity and the height of the barrier of the Al-Al2O3 contact are determined. The dependence of the heat flux through junctions with films of difference thicknesses on the electron conduction of the films is established.
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