Experimental study of a thin thermally grown oxide layer in thermal barrier coatings based on the SWT-BP algorithm and terahertz technology

Abstract

As a promising nondestructive testing (NDT) technique with a very adaptive physical modeling of wave transmission process, terahertz technology is used for the detection and characterization of nonpolar materials and the evaluation of layered and/or defective structures. THz-TDS can also be used to perform spectroscopic analysis and detect structural defects in thermal barrier coatings (TBCs) of aero-engines. Although it is generally difficult to measure the structure of the thin oxide layer of the thermal barrier coatings whose thickness is generally lower than 30 µm (the current axial resolution of the THz-TDS cannot exceed 30 µm). We were able to complete the detection of the oxide layer within 1–29 µm through simulation by using the SWT-BP algorithm. In this study, the analysis was performed on real-world samples, the fitting degree of the SWT-BP algorithm reached 0.77, and the minimum prediction error was less than 0.1 µm. The paper also put forward some improvement measures about the experimental results.