Abstract

Objective. The purpose of the study is to illuminate the obtained experimental research data, measurement technique, as well as the design of a la-laboratory bench for full-scale tests of thermoelectric system (TES) for uneven cooling of electronic boards.Method. The article describes the experimental set-up and measurement procedure of laboratory thermoelectric system for electronic circuit boards cooling. The experimental stand is made on the basis of the measuring equipment of the laboratory of semiconductor thermoelectric devices and devices of Daghestan State Technical University.Result. We obtained plots of time dependences of temperature changes in thermoelectric system checkpoints at different thermoelectric battery (TEB) supply currents. Determined were the temperature dependences of the thermoelectric elements of the electronic board simulator at their non-uniform cooling on the parameters of FEB and working substance as well as the time variation of the temperature of the shell of the vessel with the working agent.Conclusion. As a result of full-scale tests of the device it was found that the use of a cooling system reduces the temperature of heat-generating elements to acceptable values. In particular, the temperature of heat sources decreases to 345 K and 344 K (from 428 K and 396 K) if the total heat-generating power of the electronic board is 120 W. At the same time, the temperature background created by the heat-generating elements in the nearby areas of the electronic board simulator also decreases. The discrepancy between the results of calculations carried out beforehand and the experiment was estimated to be 8%.

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