Abstract
In this work experimental results on a built in current sensor for dynamic current testing, i/sub ddt/, based on integration concepts are presented. The experimental validation proposed in this work is done through a VLSI CMOS circuit implemented in a 0.7 micron technology. Different experiences have been developed analyzing the detectability of several kind of defects through this technique. The encouraging results obtained present this technique as an attractive complement to boolean and I/sub DDQ/ testing.
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