Abstract
Based on unilateral total internal reflection illumination, a tip spectral response detection setup is built. This provides an experimental method for revealing the spectral response and resonance band, which are significant in investigating optical properties and the field enhancing mechanism. The spectral responses of silicon tips coated with gold and silver are detected. These tips are then used in tip-enhanced Raman spectroscopy (TERS) detection under 532 nm excitation to demonstrate the effect of resonant excitation on field enhancement. The corresponding relationship between the measured spectral response and the tip’s enhancement performance in TERS is discussed.
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