Abstract
The phase diagram of the ternary system Ti–Si–Sn system at 473 K was investigated by means of powder X-ray diffraction (XRD), differential thermal analysis (DTA) and scanning electron microscope (SEM) with energy dispersive analysis (EDX). The isothermal section consists of 14 single phase regions, 26 binary phase regions and 13 ternary phase regions. The 10 binary compounds, namely Ti 3Si, Ti 5Si 3, Ti 5Si 4, TiSi, TiSi 2, Ti 3Sn, Ti 2Sn, Ti 5Sn 3, Ti 6Sn 5, Ti 2Sn 3, have been confirmed at 473 K. Moreover, a ternary phase with the crystal structure of tetragonal W 5Si 3 structure type and I4/mcm space group is confirmed in the Ti–Si–Sn system. The combined results of both EDX and XRD show that the composition of this ternary phase is 60.25–61.03 at.% Ti, 15.01–21.77 at.% Si and balance Sn.
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