Abstract
In Electron Rutherford Backscattering Spectroscopy (ERBS) energetic electrons (in our case up to 40 keV) impinge on a target and one measures the energy of elastically scattered electrons. This energy depends on the mass of the scattering atom, due to the recoil effect. This technique thus provides information about the sample composition. For single crystals the interaction of the projectile electron with the crystal potential modifies the angular intensity distribution of the scattered electrons. This leads, for example, to the well-known Kikuchi patterns. Here we investigate if such modified angular distribution has any influence on the intensity ratio of the observed elastic peaks in ERBS. Dramatic effects are found. Implications of these observations for quantitative surface analysis using energetic electrons are discussed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
