Abstract
We employ electrostatic force microscope (EFM) techniques to explore local electrical properties of suspended graphene on Cu foil, SiO2/Si and PET substrate. By using electrical modulation of amplitude in a tapping mode atomic force microscope tip, we can obtain distinguished electrostatic force amplitude mapping of graphene on various substrates. In particular, at nano-valley domains on Cu and a SiO2/Si surface, relatively weaker electrostatic attractive interaction is observed than at nano-peak domains. In SiO2/Si, we find that electrostatic force distribution of graphene still follows the substrate surface morphology. Furthermore, employing EFM to graphene on a PET system can be suggested as a facile tool to investigate electrical performance of graphene.
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