Abstract
Temperature-stable, low-loss Ca5−xAxB2TiO12 (A=Mg, Zn, Ni, and Co; B=Nb and Ta) dielectrics suitable for microwave telecommunication applications were prepared by the conventional solid-state ceramic route. Investigations were made on the structure and microstructure of the ceramics employing x-ray and scanning electron microscopic techniques. The dielectric properties were measured in the 3.5–7GHz frequency range. The time domain simulation of electromagnetic wave interaction with dielectric materials, using three-dimensional transmission line matrix modeling methods, is presented. Excellent agreement between experimental and simulated values of microwave dielectric properties was observed. The materials are potential candidates for applications in filters, oscillators and high efficiency low-loss dielectric antennas working especially at millimeter wave region.
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