Abstract
Copper -doped Strontium Titanate (STO) with Copper filler percentages of 5% and 10% was prepared through a solid-state reaction method at high temperatures. The structural study of the materials was characterized by the X-ray diffraction technique and confirmed to be in the Cubic phase. Also, the surface morphology of the samples was studied by scanning electron microscopy. The impedance study of the samples was characterized by an LCR meter between the frequencies ranges 102-106 Hz. The exponential dependence of ac conductivity on frequency was confirmed where the value of ac conductivity increases with the rise in filler concentration from 5% to 10%.
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