Abstract
The scattering phenomenon caused by rough surfaces has a dominant role in shaping the reflected field at terahertz (THz) frequencies, both in specular and non-specular directions. Most surfaces in nature are randomly rough, and the surface height obeys a certain statistical distribution. A Gaussian probability density function (PDF) for height distribution is often considered, and the correlation length is assumed to be longer than the wavelength. However, a clear understanding of how changing these assumptions affect the angular distribution of the scattered field is still lacking. In the first part of this work we investigate via microscopic measurements the statistical distribution of realistic indoor materials, and its deviation from the assumed normal distribution. After that, the influence of non-Gaussianity on the specular reflection in the low THz region is shown analytically. In the second part, a measurement campaign of diffuse scattering, caused by structured statistically-controlled surfaces, is reported. The correlation length assumption has been proven experimentally and via full-wave simulation to affect the diffuse scattering by rough samples, when the other statistical parameters are kept without changes.
Highlights
Global mobile data traffic is expected to exceed 77 exabytes per month by 2022 [1], which is more than double the data traffic in 2019
In case we aim to investigate the lateral correlation effect, the statistics condition will be fulfilled if the sample size is much larger than the correlation length
The second part of this work is dedicated to the study of correlation length assumption and its effect on the diffuse scattering profile
Summary
Global mobile data traffic is expected to exceed 77 exabytes per month by 2022 [1], which is more than double the data traffic in 2019. The field distribution in the angular domain is approximated by assuming a Lambertian scattering pattern and developed later to a directive pattern Such models characterize roughness by only measuring or estimating one single parameter, the surface heights’ standard deviation. The second part of this work is dedicated to the study of correlation length assumption and its effect on the diffuse scattering profile This is carried out via bistatic full-wave simulations and scattering measurements on constructed rough materials. An areal three dimensional (3D) roughness measurement is conducted over an area of the surface In this work, the latter method is used in the form of a high accuracy non-contact laser confocal microscopy system. By employing in relation (11), the specular reflection factor for the Gaussian case is
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