Abstract
Self-assembled opal crystals (bulk silica opals and PMMA thin opal films)have been studied by atomic force microscopy (AFM) and optical spec-troscopy. Reflectance and transmittance spectra (R(λ) and T (λ), respectively)as well as spectra of ellipsometric parameters Ψ(λ) and Δ(λ)demonstratepronounced changes with changing the angle of light incidence. Diameters ofspheres obtained from AFM-images correspond to those obtained from Braggfit to the diffraction resonance dispersions. The band of light losses detected byellipsometry at the spectral range of avoided band crossing of opal eigenmodeswas assigned to the energy exchange between these modes
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