Abstract
Vapor deposited glasses got wide scientific attention as they are remarkably stable and dense materials with significant practical applications. In this work, we investigate the presence of irreversibly adsorbed material on vapor deposited celecoxib films on silicon substrate using the Guiselin method. Using this approach, we provide experimental evidence for the presence of irreversibly adsorbed material on the substrate; especially for ultrastable glasses. We have also observed variation in the amount of irreversibly adsorbed material, when the rate of deposition and the substrate temperature deviates from the optimal deposition conditions to form ultrastable glass. The surface characterization of adsorbed material done with AFM is complimented with XPS and TOF-SIMS measurements to obtain the physical and chemical nature of the irreversibly adsorbed material.
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