Abstract

Aging in dielectrics manifests as a reduction in capacitance over time owing to the applied electric field. This study revisits the aging mechanism in multi-layer ceramic capacitors (MLCCs), specifically considering DC-bias voltage and temperature variables. The findings indicate that aging is intensified by higher DC-bias voltages (electric field strength) and elevated temperatures, ultimately leading to capacitance saturation. A poling–depoling experiment confirms the rapid assessment of saturation capacitance. Consequently, we propose a straightforward method involving electric field manipulation to quantitatively evaluate the saturated capacitance of MLCCs under aging conditions. The estimated capacitance aligns closely with the measured capacitance after 2000 h, with an error rate not exceeding 4 %.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call