Abstract
Knowledge of the absolute electron-induced production of the characteristic x-rays for different lines and elements is required for proper evaluation of the characteristic fluorescence correction or for development of “standardless” x-ray quantitative analysis correction procedures. Determination of absolute generated x-ray intensities in thick specimens or even relative generated x-ray intensities for lines of different elements in thick specimens is quite difficult as demonstrated by the lack of agreement of the published attempts to determine absolute generated x-ray intensity yields. The amount of absorption of the generated x-ray intensity in the sample and the amount of x-ray production from secondary fluorescence by other characteristic lines or by the continuum must be calculated. Moreover, the detector efficiency for measuring the different lines must be known. Most investigations of absolute generated x-ray intensities suggest that there is a functional relationship between the generated intensity and the overvoltage (U = Eo/Ec) at which the measurement is made.
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Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
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