Abstract

The experimental determination of x-ray-production cross sections by electron impact on thick samples is faced in this work, especially focusing on the $L$ subshells of Ag. The integrodifferential method used by An et al. is compared with a recently implemented approach involving the ionization distribution function. The first method has shown good results under suitable conditions, namely, when multiple scattering, bremsstrahlung enhancement, and other secondary effects are negligible. Monte Carlo simulations were performed in order to analyze the influence of these conditions and therefore to extend the validity range of the method by adding a correction factor. The second approach uses the ionization distribution function $\ensuremath{\phi}(\ensuremath{\rho}z)$ to predict the intensity of the emitted photons; this magnitude is assessed by the poema software, previously developed, and it is used to determine correction factors to the cross sections included in the software database. Both approaches were tested by fitting several $L$-shell spectra measured in a wide interval of incident electron energies, ranging from 4.0 to 25 keV, with an electron microprobe equipped with a wavelength-dispersive spectrometer. The x-ray-production cross sections obtained for each $L$ subshell and the total $L$ x-ray-production cross section were compared with theoretical predictions based on the distorted-wave approach theory and with experimental determinations when available.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.