Abstract
We report Magnetic Circular X-ray Dichroism (MCXD) measurements of Ni, Co and Fe overlayers on a Cu(100) surface. These films grow pseudomorphically and were characterized in situ. MCXD measurements as function of the X-ray incidence angle allow saturation effects to be removed before applying the MCXD sum rules for the determination of magnetic moments. By applying the MCXD sum rules to thick overlayers we obtain values for the magnetic moments that differ from those for the bulk. A comparison of the present set of data to others in the literature indicates that the origin for this discrepancy appears to be linked to the different crystal structure of these overlayers on various substrates.
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