Abstract
Paper presents the technique suitable for the determination of the linear electro-optic effect (LEOE) tensor components in crystal materials of any symmetry. The method is based on the Michelson interferometer where the sample being studied is set into the one of its arms to measure the electro-induced changes of the optical path. We describe in details the sample geometries that are needed to determine a complete set of the LEOE tensor components as well as derive the corresponding equations. The experimental technique has been tested and verified on the lithium niobate crystals as well as applied to MgO-doped LiNbO3 crystals to study their electro-optic properties.Paper presents the technique suitable for the determination of the linear electro-optic effect (LEOE) tensor components in crystal materials of any symmetry. The method is based on the Michelson interferometer where the sample being studied is set into the one of its arms to measure the electro-induced changes of the optical path. We describe in details the sample geometries that are needed to determine a complete set of the LEOE tensor components as well as derive the corresponding equations. The experimental technique has been tested and verified on the lithium niobate crystals as well as applied to MgO-doped LiNbO3 crystals to study their electro-optic properties.
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