Abstract

The purpose of this study is multiparameter asymptotic analysis of the stress field in the immediate vicinity of the crack tip in a linearly elastic material and construction of complete asymptotic expansion of M. Williams stress field in the vicinity of the crack tip. Multiparametric analysis of the stress field is based on the polarization-optical methods of mechanics of a deformable solid (the method of photoelasticity). Digital processing of the results of optoelectronic measurements performed on a series of samples with cracks and notches is carried out. Different classes of samples from optically sensitive materials, in particular a sample with two collinear cracks under conditions of normal detachment, were considered. A set of programs has been prepared that makes it possible to determine the scale (amplitude) multipliers of complete asymptotic expansion of M.Villiams for the stress field at the crack tip. Using the basic law of photoelasticity, first five coefficients of complete asymptotic expansion of M. Williams are calculated. The results of the experiments are compared with the available analytical solution. It is shown that the results of processing optoelectronic measurements are in good agreement with the analytical solution obtained for an infinite plate with two collinear cracks.

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