Experimental demonstration of novel beam characterization using a polarizable X-band transverse deflection structure

Barbara Marchetti ,M Hoffmann,G Tews,F Marcellini,M Pedrozzi,R Ganter,S Reiche,P Craievich,S Schreiber,Richard D’arcy ,Pau González Caminal ,R Fortunati,Mathias Vogt ,H Braun ,Jens Osterhoff ,Nuria Catalán Lasheras ,Sonja Jaster-Merz ,Alexej Grudiev ,R Jonas,Daniel Marx ,M Huening,Ralph Aßmann ,Florian Christie ,S Wesch,Eduard Prat ,Gerard Mcmonagle ,Matthias Reukauff ,Walter Wuensch

doi:10.1038/s41598-021-82687-2

Abstract

The PolariX TDS (Polarizable X-Band Transverse Deflection Structure) is an innovative TDS-design operating in the X-band frequency-range. The design gives full control of the streaking plane, which can be tuned in order to characterize the projections of the beam distribution onto arbitrary transverse axes. This novel feature opens up new opportunities for detailed characterization of the electron beam. In this paper we present first measurements of the Polarix TDS at the FLASHForward beamline at DESY, including three-dimensional reconstruction of the charge-density distribution of the bunch and slice emittance measurements in both transverse directions. The experimental results open the path toward novel and more extensive beam characterization in the direction of multi-dimensional-beam-phase-space reconstruction.

Highlights

The PolariX Transverse deflection structures (TDS) (Polarizable X-Band Transverse Deflection Structure) is an innovative TDS-design operating in the X-band frequency-range
The electron bunch is generated by an RF-photoinjector and initial acceleration is carried out by the FLASH superconducting radio-frequency (SRF) stage using superconducting niobium accelerating cavities
We presented the first characterization of the electron beam at FLASH performed using the PolariX TDS

Summary

Introduction

The PolariX TDS (Polarizable X-Band Transverse Deflection Structure) is an innovative TDS-design operating in the X-band frequency-range. The design gives full control of the streaking plane, which can be tuned in order to characterize the projections of the beam distribution onto arbitrary transverse axes. This novel feature opens up new opportunities for detailed characterization of the electron beam. Emittance[4] is a property used to characterize the quality of a particle beam in terms of its size and divergence It represents - or it is linked to - the volume occupied by the particles in their phase-space.

Methods

Results

Conclusion