Abstract

Stress-induced failure is a critical concern that influences the mechanical reliability of an indium tin oxide (ITO) film deposited on a transparently flexible polyethylene terephthalate (PET) substrate. In this study, a cycling bending mechanism was proposed and used to experimentally investigate the influences of compressive and tensile stresses on the mechanical stability of an ITO film deposited on PET substrates. The sheet resistance of the ITO film, optical transmittance of the ITO-coated PET substrates, and failure scheme within the ITO film were measured to evaluate the mechanical stability of the concerned thin films. The results indicated that compressive and tensile stresses generated distinct failure schemes within an ITO film and both led to increased sheet resistance and optical transmittance. In addition, tensile stress increased the sheet resistance of an ITO film more easily than compressive stress did. However, the influences of both compressive and tensile stress on increased optical transmittance were demonstrated to be highly similar. Increasing the thickness of a PET substrate resulted in increased sheet resistance and optical transmittance regardless of the presence of compressive or tensile stress. Moreover, J-Integral, a method based on strain energy, was used to estimate the interfacial adhesion strength of the ITO-PET film through the simulation approach enabled by a finite element analysis.

Highlights

  • Indium tin oxide (ITO) film is transparent and has a low electrical resistance

  • Compressive and tensile stress loads were exerted on an ITO-polyethylene terephthalate (PET) film by applying a bending cycling test to explore the influence of stress on the mechanical stability of the aforementioned stacked thin films

  • The sheet resistance of the ITO film increased whether the film was subjected to compressive or tensile stress, for which the tensile stress increased the sheet resistance of the ITO film more than the compressive stress did

Read more

Summary

Introduction

Indium tin oxide (ITO) film is transparent and has a low electrical resistance. ITO film has been increasingly deposited on transparent flexible polyethylene terephthalate (PET) substrates as the electrode for a wide range of items such as displays, sensors, and solar cells [1,2,3,4]. Compared with a PET substrate exhibiting a lower Young’s modulus, the brittle ITO film deposited on PET has a large Young’s modulus [5]. Severe residual stress is generated within an ITO film because of the substantial elastic mismatch between the PET substrate and ITO film [6,7,8]. Failure may possibly be generated within the ITO film, thereby degrading the electrical property and the optical transmittance of the ITO film. Grego et al [9]

Methods
Results
Conclusion
Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call