Abstract

Polycrystalline ZnTe thin films have been deposited by industrially viable electron beam evaporation technique. The effect of substrate temperature on its structural, vibrational and optoelectronic properties has been investigated. The results are complemented with the ab initio calculations performed using density functional theory for bulk ZnTe. X-ray diffraction studies reveal that the films crystallize in zinc blende structure and the highest crystallinity has been observed for the films deposited at 373 K. The surface morphology and roughness of the films have been studied through scanning electron microscopy and atomic force microscopy. Raman spectroscopy has been used to study the vibrational properties of the films and the frequency of the optical phonon modes are in close agreement with that of the ab initio calculations. Optical absorption and photoluminescence spectroscopy has been used to investigate the optoelectronic properties of ZnTe thin films. The individual orbital contributions to the valence and conduction band edges have been analysed through the density functional theory.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.