Abstract
This letter presents an EXtrinsic Information Transfer (EXIT) chart tool for the puncturing of non-binary (NB) low-density parity-check (LDPC) codes. With the help of this tool, we study the dependence of the performance of various bitwise and symbolwise puncturing patterns on the degree of a variable node (VN). The grouping algorithm (GA) is a useful technique for the short-length codes to find the recoverable VNs. By incorporating the GA under the EXIT chart model, we propose a method to find the optimum recoverable puncturing pattern.
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