Abstract
The problem is considered of efficient test design for combinational devices with large numbern of input variables, where each output depends on at mosts input variables. It is shown that the number of test patterns can be reduced drastically if we allow a small fraction? of all possible outputs not to be tested exhaustively. The effect holds even if? approaches zero with the increase ofn. Upper and lower bounds for the number of test patterns in such tests (called (?, s)-exhaustive tests) are derived and constructions of the tests are suggested.
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