Abstract

Derived through liquid phase exfoliation, the irradiation response of nanoscale, exfoliated tin sulfide (SnS) systems are being reported in this work. The SnS nanosheets were exposed to 90[Formula: see text]MeV [Formula: see text] ion beams across fluences ranging from [Formula: see text] to [Formula: see text][Formula: see text]ions/cm2. With an electronic energy loss ([Formula: see text]) of [Formula: see text]56[Formula: see text]eV/Å, dominating over the nuclear energy loss ([Formula: see text]), the average crystallite size of the irradiated samples displayed an augment when compared to its pristine counterpart. Exhibiting an orthorhombic crystal structure, structural analyses of both pristine and irradiated samples were conducted via X-ray diffraction (XRD) technique. Raman analysis has manifested some modifications in the SnS nanosystem upon radiation exposure, particularly with higher fluences causing local structural disorder and amorphization of the material. Moreover, morphological changes in the irradiated SnS samples were examined using field emission scanning electron microscopy (FESEM) and atomic force microscopy (AFM), with AFM images revealing an increase in the root mean square (RMS) roughness corresponding to ion fluence. Furthermore, swift heavy ion (SHI) irradiation prompted a non-rectifying Ohmic [Formula: see text] characteristics and altered the electrical conductivity of the SnS nanosheets.

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