Abstract
Crystalline morphology in the blends of poly(ether ether ketone) (PEEK) and poly (ether imide) (PEI) was investigated by small-angle X-ray scattering. The lamellar thickness was found to be constant (≈ 6 nm, independent of blend composition). The long period in 80 20 PEEK/PEI blend was greater than that in neat PEEK, whereas 50 50 PEEK/PEI blend showed intermediate value. This result suggests that a large amount of PEI impurity is excluded from interlamellar region in the high PEI content blend, whereas the exclusion is negligible and most PEI chains reside between lamellae in the low PEI content blend. The population of secondary lamellae, estimated by the interface distribution function analysis, was lowest in the 80 20 blend, suggesting that the formation of the secondary lamellae is restricted by the presence of the large amount of impurity between primary lamellae.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
