Abstract
Abstract Organic light-emitting diodes (OLEDs) are attractive for display and lighting applications. However, the demand for high stability in outdoor display and lighting requires further material and device developments and theoretical modeling. Here an analytical function for predicting time-dependent luminance loss in OLEDs is derived based on excitonic defect generation and interaction. Despite the simplicity, this function fits extremely well vast amount of experimental data reported by numerous industrial and academic laboratories for a variety of devices including simple bilayer devices and multilayered devices using singlet, triplet, multiple emitters in variety of host:dopant combinations. The uniqueness of the derived function is expected to allow it to be broadly used for understanding root-cause in degrading devices and for modeling OLED lifetime.
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