Abstract
Free-exciton luminescence dynamics at the surface and deep inside of a ZnO single crystal are investigated by one- and two-photon excitation mothods. The free-exciton lifetime is carefully evaluated at each position by considering the excitonic diffusion effect and the trapping process inside the sample. The obtained temperature dependence of the lifetime indicates that the photon recycling effect dominates the exciton lifetime inside the sample while the K-selection rule determines the lifetime at the surface.
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