Abstract
AbstractSingle crystalline films (SCF) of LuAP attract attention because of the perspective of its application as 2D screens for X‐ray registration with high spatial resolution. An intensive sharp reflectivity peak at the edge of the fundamental absorption region with maximum at 8.37 eV at 10 K was found for a series of LuAP SCF grown by liquid phase epitaxy on YAP substrate. The dependence of the peak maximum and profile on temperature demonstrates its exciton origin. The absorption spectrum was calculated from reflectivity using Kramers–Kronig relations; the bandgap value was determined for LuAP as Eg = 8.44 eV at 10 K. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
