Excitation-dependent recombination and diffusion near an isolated dislocation in GaAs

Abstract

In low-magnification, plan-view photoluminescence images of a nominally lattice-matched, undoped GaAs/GaInP heterostructure, we observe a random distribution of isolated dark spots. We attribute the dark spots to crystal dislocations, where nonradiative recombination is augmented by transitions utilizing defect-related energy levels between the conduction and valence bands. We note that, when the laser excitation intensity is reduced, the darkened regions expand. At lower excitation, the density of photogenerated electrons and holes is reduced, and they are more likely to reach the defective region before encountering a partner for radiative recombination. When we model the behavior with a simulation that allows for Laplacian diffusion and defect-related recombination only through mid-bandgap energy levels, we do not obtain good agreement between experimental and simulated images. But if we allow for an arbitrary distribution of defect levels, such that the occupation of the levels and bands can change independently, we have more flexibility for fitting the density-dependent recombination rates. The more sophisticated model produces results that are more consistent with experimental images.