Abstract
The dependence of the interlayer coupling on both the soft (FeTaN) and hard (FeSm) layer thickness in FeTaN-FeSm-FeTaN multilayers, deposited by dc magnetron sputtering, has. been investigated. The magnetization reversal process is examined experimentally using a magnetooptical Kerr effect. The exchange field H/sub ex/, which is a measure of the average coupling between the soft and hard layers, was determined from the field shift of the minor hysteresis loop. The value of H/sub ex/ increases as the number of the soft FeTaN layer increases. A significant and fully reversible transverse hysteresis loop was measured indicating that, during the magnetization-reversal process, the magnetic moments in the soft layers rotate reversibly, as typical of exchange-spring systems.
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