Abstract
The present work reports the appearance of the exchange bias (EB) effect at low temperatures in epitaxial Fe thin film deposited on single crystalline LaAlO3(001) substrate. The observed EB effect vanishes around 30 K indicating that it could be due to the formation of antiferromagnetic FeO layer at the interface between Fe and LaAlO3 substrate. The EB in Fe/LaAlO3(001) is further substantiated by comparing the observations with polycrystalline Fe film deposited on silicon substrate, kept adjacent to LaAlO3 substrate during the deposition. Magnetic microstructure measured by Kerr microscopy corroborates the structural data of Fe film i.e., cubic four-fold anisotropy and isotropic nature for Fe film deposited on LaAlO3 and silicon substrates, respectively. Further, low temperature Kerr microscopy results reveal that the magnetization reversal process significantly gets modified due to the induced unidirectional anisotropy as a consequence of FeO layer formation at Fe/LaAlO3 interface.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
