Abstract
The applicability of the simultaneous use of particle induced X-ray and gamma-ray emission (PIXE/PIGME) for nondestructive analysis of art paintings has been investigated. By proper choice of detection geometry and proton energy the PIXE/PIGME combination yields almost covering elemental analysis of inorganic pigments even through the surface varnish of the painting. Accordingly the method is very suitable for example for a rapid detection of pallette errrors.
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