Abstract
A new application of EXAFS for obtaining structural information about adsorbates on surfaces will be described. This new Surface-EXAFS, or SEXAFS, technique monitors the adsorbate Auger electron intensity as a function of photon energy as the photon energy is swept through an absorption edge of the adsorbate. The EXAFS spectrum so obtained provides direct detailed structural information about the bonding and position of the adsorbate. The essential components of the technique are a synchrotron, an electron energy analyzer, and an ultra-high vacuum chamber (10 −10 torr) in which the sample is prepared, characterized and measured. The experiments are made possible by a new focussing and tunable spectrometer recently constructed at the Stanford Synchrotron Radiation Project, where fluxes of the order of 10 11 photons/mm 2 are obtained. With spectrometer of this type coupled directly to a storage ring and with a more complete capability for monochromatizing all photon energies, the SEXAFS technique should allow one to study all adsorbates with atomic number greater than carbon at atom averages as low as 0.1 to 0.01 monolayers.
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