Abstract
The high intensities available using synchrotron source insertion devices potentially extend the range of adatom surface coverage on well prepared surfaces that may be experimentally studied to very low levels. In this paper we report the results of a fluoresence EXAFS study of a 0.5 nm thick hafnium film in the vicinity of its LIII absorption edge (9561 eV). This film was deposited on a platinum-carbon nmultilayer having a period of 31.7Å. These results indicate that EXAFS studies of species at surface coverages of 0.01 monolayer are easily experimentally accessible.
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