Abstract
As reported previously the tip current of a scanning tunneling microscope (STM) is excited by irradiation of x-rays on the sample. This x-ray-excited STM tip current originates from electrons emitted from the sample surface. We measured the STM tip current excited by synchrotron radiation for Au-Ni thin-film samples as the x-ray energy was scanned near the Au L III and Ni K absorption edges. It was found that the STM tip current increased at the x-ray energy near the absorption edge and extended x-ray adsorption fine structure (EXAFS)-like and x-ray adsorption near-edge structure (XANES)-like spectra were obtained. The experimental result using the tip coated with insulator suggested that the analysing area was ∼ 1.0 mm in diameter.
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