Abstract
Nanocrystals of Y and Zr doped SnO2 have been prepared by sol-gel route and annealed at 200, 400, 600, 800 and 1000 ºC. The X-ray diffraction (XRD) results showed the average size of the particles in the freshly prepared samples to be ~ 3 nm. The Extended Absorption Fine Structure (EXAFS) technique was used to study the dopant environments in nanocrystalline tin oxide. In all Y-doped samples, except the one annealed at 1000 ºC, there is clear evidence that Y has not entered the SnO2 lattice. This is clearly supported by the Raman scattering results. In all Zr-doped samples, there is a simple substitution for Sn by Zr.
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