Abstract
The reflectivity variations of a dielectric thin film during the deposition of a disordered monolayer of metallic nanoparticles are studied. We present experimental results and provide theoretical physical insight into the behavior of the reflectivity signal and its dependence on the dielectric thin-film thickness and structural features of the monolayer of nanoparticles. A closed-form expression is used to describe the reflectivity of a disordered monolayer of particles on a flat substrate within the frame of a coherent-scattering model approach. It is shown that the model reproduces qualitatively the behavior of the reflectivity signal during the experiment. Finally we study the optical response in the limit of small particles for low surface coverage fractions of the monolayer to evidence the main parameters that dictate the evolution of the reflectivity signal during the growth of a monolayer of nanoparticles.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
