Abstract
Submicron thin solid films of bis(n-propylimido)perylene have been fabricated on several substrates by vacuum evaporation. The effect of postdeposition thermal annealing on the molecular orientation was examined using in situ reflection absorption infrared spectroscopy. The interpretation of the vibrational infrared and Raman spectra of the neat material and films was first undertaken to provide the vibrational backgrounds for the interpretation of changes observed on thermal annealing by reflectance spectroscopy. The spectroscopic characterization include FT Raman, electronic, and emission spectra of solutions, bulk solid, and nanometric films.
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