Abstract
ABSTRACTThe structural properties of InxGa1−xN epilayers, deposited on (0001) AlN templates by plasma-assisted molecular beam epitaxy, were studied by transmission electron microscopy and Raman spectroscopy, as a function of growth temperature. Single phase films with high indium content and well-ordered heteroepitaxial interfaces were attained at lower temperatures. Delayed plastic relaxation resulted in the structural stratification of high-temperature films due to the compositional pulling. Such films relaxed by a stacking fault mechanism, contrary to low temperature ones that exhibited relaxation by misfit dislocations. Despite the higher defect content of the former, their phonon mean free path was also higher, showing that alloying-induced fluctuations of the periodic potential constitute a more critical parameter. Cubic interfacial zones were suppressed at lower growth temperatures.This is part of a thematic issue on Nanoscale Materials Characterisation and Modeling by Advances Microscopy Methods - EUROMAT.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
