Abstract

The evolution of interface configuration during sapphire crystal growth by Czochralski method was studied on the basis of chemical bonding conditions at crystal/melt interface. On the basis of chemical bonding theory of single crystal growth, when sapphire single crystal was grown along the c axis direction in Czochralski system, crystal/metal interface is composed of six crystallographically equivalent {110} interfaces thermodynamically. With the rotation of sapphire single crystal in the growth process, the interface configuration developed from hexagon to circle due to the appearance of {100} surfaces and {h10} microfacets at the intersection of two adjacent interfaces. The (h10) microfacet is made of (100) and (110) planes. Lower chemical bonding densities at the {100} surfaces and {h10} microfacets relative to that at {110} surfaces thermodynamically drive the formation of round interface configuration in sapphire Czochralski crystal growth along the c axis direction.

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