Abstract
Hydrothermally grown ZnO samples have been annealed in Ar, Zn-rich, and O-rich ambients and investigated by deep level transient spectroscopy (DLTS). The DLTS measurements reveal up to 6 different defect levels in the band gap after different annealing conditions. A clear correlation has been found between the annealing treatment and the formation/suppression of two deep defect levels at ∼0.2 and ∼0.5 eV below the conduction band edge (Ec). As a result, the Ec-0.5eV level is assigned to a Zn-rich defect while the Ec-0.2eV level is due to a O-rich defect, where the latter shows donor behavior as revealed by a distinct Poole-Frenkel effect.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
