Abstract
The surface roughness of evaporated gold films has been studied by scanning tunnelling microscopy and analysed by a Fourier transform method. The power spectrum S( q, t) presents a clear q − γ dependence in the high-frequency region and t β behaviour of the total interface width of the films. The values obtained for the two exponents, in the range of 300–18 000 Å thickness studied ( γ=4.1±0.1 and β=0.26±0.02), agree with the theoretical predictions ( γ=4 and β=0.25) for a pure diffusion-controlled process but not with a re-evaporation process. The power spectrum for high frequencies shows good correlation for different film thicknesses, describing scaling without anomalous behaviour.
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