Abstract
Nonplanar field emission from electrochemically etched tungsten field emitters has been observed using near field emission scanning electron microscopy. Close-proximity field emission in adequate ultrahigh vacuum conditions was implemented to attain Fowler–Nordheim plots using typical imaging parameters. The emission radii deduced via a detailed, spherical surface field emission theory, by [Edgcombe and de Jonge, J. Phys. D 40, 4123 (2007)], reveal that our sharpest tip asperities are less than a nanometer. This yields a spatial resolution on the order of one nanometer.
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