Abstract
Imaging of the surface magnetic structure of Cr(001) films epitaxially grown on Au(001) film was performed by using spin-polarized scanning tunneling spectroscopy and Fe-coated W tips. It is shown that two-step growth of a 4-nm-thick Cr layer having two different growth temperatures results in a chemically clean surface and makes it possible to observe distinct spin contrast. The spatially resolved maps of dI/dV signals taken at room temperature indicated that the topological antiferromagnetic order on the thin Cr(001) film surface that is subject to high-density steps and screw dislocations.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
