Abstract
Imaging of the surface magnetic structure of Cr(001) films epitaxially grown on Au(001) film was performed by using spin-polarized scanning tunneling spectroscopy and Fe-coated W tips. It is shown that two-step growth of a 4-nm-thick Cr layer having two different growth temperatures results in a chemically clean surface and makes it possible to observe distinct spin contrast. The spatially resolved maps of dI/dV signals taken at room temperature indicated that the topological antiferromagnetic order on the thin Cr(001) film surface that is subject to high-density steps and screw dislocations.
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