Abstract
Novel glasses within the Si–O–N system were synthesized by melting mixtures of crystalline α-SiO 2 and α-Si 3N 4 in the range from 2.9 to 24 at.% nitrogen. X-ray diffraction (XRD) and Fourier transformation infrared spectroscopy (FT-IR) measurements indicate the formation of ternary phases in an amorphous state. The incorporation of nitrogen into the network structure was proven by 29 Si magic angle spinning nuclear magnetic resonance (MAS-NMR) and Si K-X-ray absorption near edge structure spectroscopic studies which both show, independently, the presence of mixed SiO 4− x N x tetrahedra ( x=0, 1, 2, 3, 4). The relative frequency of these units as derived from the deconvolution of 29 Si -MAS-NMR spectra is in agreement with a random distribution of nitrogen within the network structure.
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