Abstract
Abstract This work describes the initial stages in the development of a system which will allow a quick and easy in-field spectrometric characterization of diagnostic X-ray beams. The spectrometric approach to the quality control procedure on diagnostic X-ray beams constitutes an advanced investigation method for monitoring and evaluating the fundamental parameters (as kVp, exposure, HVL, total filtration, etc.) when compared to the classical methods performed by several and specific dedicated instruments. Toward this aim particular care has been taken in the choice and study of the best suited detector unit. Owing to the very promising characteristics of cadmium telluride (CdTe) as a room temperature semiconductor detector, the possibility was investigated of using it in order to elude the main technical problems associated with the use of cooled semiconductor detectors in such a specific application. The investigation was made both in term of dimensions and geometric configuration of the detector, in order to optimize the match between energy response and efficiency. The obtained results are reported and discussed.
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